Semiconductor (IV/CV) Characterization System with Probe Station
The Semiconductor (IV/CV) Characterization System is used for precise electrical characterization of semiconductor devices. The Keithley 4200A-SCS parameter analyzer delivers synchronizing current-voltage (I-V), capacitance-voltage (C-V) and ultra-fast pulsed IV measurements. It supports failure analysis, manual analytical probing, probe stations and MEMS probing.
Manufacturer:
Keithley Instruments / Tektronix (India) Pvt. Ltd., Bengaluru and Signatone, USA
Model:
Keithley 4200A-SCS Parameter Analyzer with Signatone S-1160 Probe Station
Applications
- I-V and C-V measurements
- Ultra-fast pulsed IV measurements
- Failure analysis
- Manual analytical probing
- Probe station measurements
- MEMS probing
Sample Requirements
- Sample preparation with metal contacts
Internal (KBCNMU): βΉ
200
External Academic: βΉ
700
Industry: βΉ
1000
GST
18% extra
Contact Information
Prof. Jaydeep Vinayak Sali
Instrument Incharge
π§
jvsali@nmu.ac.in
π
8421806270